参数资料
型号: AD6641-500EBZ
厂商: Analog Devices Inc
文件页数: 26/28页
文件大小: 0K
描述: BOARD EVALUATION FOR AD6641
设计资源: AD6641 BOM
标准包装: 1
系列: *
AD6641
Rev. 0 | Page 7 of 28
AD6641-500
Parameter1
Temp
Min
Typ
Max
Unit
LOGIC OUTPUTS
DDR LVDS Mode (PCLK±, PD[5:0]±, PDOR±)
Logic Compliance
Full
LVDS
VOD Differential Output Voltage
Full
247
454
mV
VOS Output Offset Voltage
Full
1.125
1.375
V
Parallel CMOS Mode (PCLK±, PD[11:0])
Logic Compliance
Full
CMOS
High Level Output Voltage
Full
DRVDD 0.05
V
Low Level Output Voltage
Full
DRGND + 0.05
V
Output Coding
Twos complement, Gray code, or offset binary (default)
1 See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for a complete set of definitions and information about how these tests were
completed.
2 5 pF loading.
SWITCHING SPECIFICATIONS
AVDD = 1.9 V, DRVDD = 1.9 V, TMIN = 40°C, TMAX = +85°C, fIN = 1.0 dBFS, full scale = 1.5 V, unless otherwise noted.
Table 4.
AD6641-500
Parameter1
Temp
Min
Typ
Max
Unit
OUTPUT DATA RATE
Maximum Output Data Rate (Decimate by 8 at 500 MSPS Sample Rate, Parallel CMOS
or DDR LVDS Mode Interface)
Full
62.5
MHz
Maximum Output Data Rate (Decimate by 8 at 500 MSPS Sample Rate, SPORT Mode)
Full
62.5
MHz
PULSE WIDTH/PERIOD (CLK±)
CLK± Pulse Width High (tCH)
Full
1
ns
CLK± Pulse Width Low (tCL)
Full
1
ns
Rise Time (tR) (20% to 80%)
25°C
0.2
ns
Fall Time (tF) (20% to 80%)
25°C
0.2
ns
PULSE WIDTH/PERIOD (PCLK±, DDR LVDS MODE)
PCLK± Pulse Width High (tPCLK_CH)
Full
8
ns
PCLK± Period (tPCLK)
Full
16
ns
Propagation Delay (tCPD, CLK± to PCLK±)
Full
±0.1
ns
Rise Time (tR) (20% to 80%)
25°C
0.2
ns
Fall Time (tF) (20% to 80%)
25°C
0.2
ns
Data to PCLK Skew (tSKEW)
Full
0.2
ns
SERIAL PORT OUTPUT TIMING2
SP_SDFS Propagation Delay (tDSDFS)
Full
3
ns
SP_SDO Propagation Delay (tDSDO)
Full
3
ns
SERIAL PORT INPUT TIMING
SP_SDFS Setup Time (tSSF)
Full
2
ns
SP_SDFS Hold Time (tHSF)
Full
2
ns
FILL± INPUT TIMING
FILL± Setup Time (tSfill)
Full
0.5
ns
FILL± Hold Time (tHfill)
Full
0.7
ns
APERTURE DELAY (tA)
25°C
0.85
ns
APERTURE UNCERTAINTY (JITTER, tJ)
25°C
80
fs rms
1 See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for a complete set of definitions and information about how these tests were
completed.
2 5 pF loading.
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