参数资料
型号: US1881LSO
厂商: Melexis Technologies NV
文件页数: 3/46页
文件大小: 498K
描述: IC LATCH CMOS MP SOT-23
标准包装: 1
传感范围: 9.5mT 跳闸,-9.5mT 释放
类型: 双极卡锁
电源电压: 3.5 V ~ 24 V
电流 - 电源: 5mA
电流 - 输出(最大): 50mA
输出类型: 数字式,开漏极
工作温度: -40°C ~ 150°C
封装/外壳: TO-236-3,SC-59,SOT-23-3
供应商设备封装: SOT-23
包装: 剪切带 (CT)
其它名称: US1881LSOCT
The Hall-Effect
The Hall-Effect principle is named for physicist Edwin Hall. In 1879 he discovered that when a conductor or
semiconductor with current flowing in one direction was introduced perpendicular to a magnetic field a voltage
could be measured at right angles to the current path.
The Hall voltage can be calculated fromV
Hall
= 肂 where:
V
Hall
= emf in volts
?=
sensitivity in Volts/Gauss
B =
applied field in Gauss
I =
bias current
The initial use of this discovery was for the classification
of chemical samples. The development of indium arsenide
semiconductor compounds in the 1950's led to the first
useful Hall effect magnetic instruments. Hall effect sen-
sors allowed the measurement of DC or static magnetic
fields with requiring motion of the sensor. In the 1960's
the popularization of silicon semiconductors led to the
first combinations of Hall elements and integrated ampli-
fiers. This resulted in the now classic digital output Hall
switch. (right)
The continuing evolution of Hall transducers technology saw a progression from single element devices to dual
orthogonally arranged elements. This was done to minimize offsets at the Hall voltage terminals. The next pro-
gression brought on the quadratic of 4 element transducers. These used 4 elements orthogonally arranged in a
bridge configuration. All of these silicon sensors were built from bipolar junction semiconductor processes. A
switch to CMOS processes allowed the implementation of chopper stabilization to the amplifier portion of the
circuit. This helped reduce errors by reducing the input offset errors at the op amp. All errors in the circuit non
chopper stabilized circuit result in errors of switch point for the digital or offset and gain errors in the linear out-
put sensors. The current generation of CMOS Hall sensors also include, a scheme that actively switched the
direction of current through the Hall elements. This scheme eliminates the offset errors typical of semiconduc-
tor Hall elements. It also actively compensates for temperature and strain induced offset errors. The overall
effect of active plate switching and chopper stabilization yields Hall-Effect sensors with an order of magnitude
improvement in drift of switch points or gain and offset errors.
Melexis uses the CMOS process exclusively, for best performance and smallest chip size. The developments to
Hall-Effect sensor technology can be credited mostly to the integration of sophisticated signal conditioning cir-
cuits to the Hall IC. Recently Melexis introduced the worlds first programmable linear Hall IC, which offered
a glimpse of future technology. Future sensors will programmable and have integrated microcontroller cores to
make an even smarter sensor.
V
H
V
H
No Magnetic
Field
V
H
V
H
South
Magnetic Field
V
H
V
H
North Magnetic
Field
V
DD
Output
GND
Digital Hall Effect Switch
V +
Differential
Amplifier
Schmidt
Trigger
Hall
Plate
Output
GND
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