参数资料
型号: MPC8555EVTAQF
厂商: Freescale Semiconductor
文件页数: 75/88页
文件大小: 0K
描述: IC MPU POWERQUICC III 783-FCPBGA
产品培训模块: MPC8544E PowerQUICC™ III
标准包装: 1
系列: MPC85xx
处理器类型: 32-位 MPC85xx PowerQUICC III
速度: 1.0GHz
电压: 1.3V
安装类型: 表面贴装
封装/外壳: 783-BBGA,FCBGA
供应商设备封装: 783-FCPBGA(29x29)
包装: 托盘
配用: CWH-PPC-8540N-VE-ND - KIT EVAL SYSTEM MPC8540
MPC8555E PowerQUICC III Integrated Communications Processor Hardware Specification, Rev. 4.2
Freescale Semiconductor
77
Thermal
Figure 49. Exploded Views (2) of a Heat Sink Attachment using a Plastic Force
The die junction-to-ambient and the heat sink-to-ambient thermal resistances are common figure-of-merits
used for comparing the thermal performance of various microelectronic packaging technologies, one
should exercise caution when only using this metric in determining thermal management because no single
parameter can adequately describe three-dimensional heat flow. The final die-junction operating
temperature is not only a function of the component-level thermal resistance, but the system level design
and its operating conditions. In addition to the component’s power consumption, a number of factors affect
the final operating die-junction temperature: airflow, board population (local heat flux of adjacent
components), system air temperature rise, altitude, etc.
Due to the complexity and the many variations of system-level boundary conditions for today’s
microelectronic equipment, the combined effects of the heat transfer mechanisms (radiation convection
and conduction) may vary widely. For these reasons, we recommend using conjugate heat transfer models
for the boards, as well as, system-level designs.
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