参数资料
型号: IDT7132LA55C
厂商: IDT, Integrated Device Technology Inc
文件页数: 10/16页
文件大小: 0K
描述: IC SRAM 16KBIT 55NS 48DIP
标准包装: 8
格式 - 存储器: RAM
存储器类型: SRAM - 双端口,异步
存储容量: 16K (2K x 8)
速度: 55ns
接口: 并联
电源电压: 4.5 V ~ 5.5 V
工作温度: 0°C ~ 70°C
封装/外壳: 48-DIP(0.600",15.24mm)
供应商设备封装: 48-SIDE BRAZED
包装: 管件
其它名称: 7132LA55C
IDT7132SA/LA and IDT 7142SA/LA
High Speed 2K x 8 Dual Port Static RAM
Military, Industrial and Commercial Temperature Ranges
Timing Waveform of Write Cycle No. 1, (R/ W Controlled Timing) (1,5,8)
t WC
ADDRESS
t HZ (7)
OE
t AW
CE
t AS (6)
t WP (2)
t WR (3)
t HZ (7)
R/ W
t WZ (7)
t OW
DATA OUT
(4)
t DW
t DH
(4)
DATA IN
2692 drw 09
Timing Waveform of Write Cycle No. 2, ( CE Controlled Timing) (1,5)
t WC
ADDRESS
t AW
CE
R/ W
DATA IN
NOTES:
t AS (6)
t EW (2)
t DW
t WR (3)
t DH
2692 drw 10
1. R/ W or CE must be HIGH during all address transitions.
2. A write occurs during the overlap (t EW or t WP ) of CE = V IL and R/ W = V IL .
3. t WR is measured from the earlier of CE or R/ W going HIGH to the end of the write cycle.
4. During this period, the l/O pins are in the output state and input signals must not be applied.
5. If the CE LOW transition occurs simultaneously with or after the R/ W LOW transition, the outputs remain in the High-impedance state.
6. Timing depends on which enable signal (CE or R/W) is asserted last.
7. This parameter is determined be device characterization, but is not production tested. Transition is measured 0mV from steady state with the Output Test Load
(Figure 2).
8. If OE is LOW during a R/ W controlled write cycle, the write pulse width must be the larger of t WP or (t WZ + t DW ) to allow the I/O drivers to turn off data to be placed on the
bus for the required t DW . If OE is HIGH during a R/ W controlled write cycle, this requirement does not apply and the write pulse can be as short as the specified t WP .
10
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