参数资料
型号: A1280A-CQ172E
元件分类: FPGA
英文描述: FPGA, 1232 CLBS, 8000 GATES, 41 MHz, CQFP172
封装: CAVITY-UP, CERAMIC, QFP-172
文件页数: 53/98页
文件大小: 2005K
代理商: A1280A-CQ172E
57
Hi R e l F P GA s
TD I
Tes t D ata In
Serial data input for JTAG instructions and data. Data is
shifted in on the rising edge of TCLK. This pin functions as an
I/O when the JTAG fuse is not programmed. JTAG pins are
only available in the 3200DX device.
TD O
Tes t D ata Out
Serial data output for JTAG instructions and test data. This pin
functions as an I/O when the JTAG fuse is not programmed.
JTAG pins are only available in the 3200DX device.
TM S
Tes t Mo de Select
Serial data input for JTAG test mode. Data is shifted in on the
rising edge of TCLK. This pin functions as an I/O when the
JTAG fuse is not programmed. JTAG pins are only available in
the 3200DX device.
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