参数资料
型号: 534AB000129DG
厂商: Silicon Laboratories Inc
文件页数: 8/12页
文件大小: 0K
描述: IC CLK XO QUAD FREQUENCY 8SMD
应用说明: Frequency Margining using the SI534
标准包装: 50
系列: Si534
类型: XO(标准)
频率 - 输出 1: 155.52Mhz,161.13MHz,167.33Mhz,173.37MHz
频率 - 输出 2: 单输出
输出: LVPECL
电源电压: 2.97 V ~ 3.63 V
封装/外壳: 8-QFN
包装: 托盘
功能: 三态(输出启用)
频率稳定性: ±20ppm
电流 - 电源(最大): 121mA
工作温度: -40°C ~ 85°C
尺寸/尺寸: 0.276" L x 0.197" W(7.00mm x 5.00mm)
高度: 7.087"(180.00mm)
其它名称: Q5073307A
Si534
Rev. 1.3
5
Table 7. Environmental Compliance
The Si534 meets the following qualification test requirements.
Parameter
Conditions/Test Method
Mechanical Shock
MIL-STD-883, Method 2002
Mechanical Vibration
MIL-STD-883, Method 2007
Solderability
MIL-STD-883, Method 2003
Gross & Fine Leak
MIL-STD-883, Method 1014
Resistance to Solder Heat
MIL-STD-883, Method 2036
Moisture Sensitivity Level
J-STD_020, MSL1
Contact Pads
Gold over Nickel
Table 8. Thermal Characteristics
(Typical values TA = 25 C, VDD =3.3 V)
Parameter
Symbol
Test Condition
Min
Typ
Max
Unit
Thermal Resistance Junction to Ambient
JA
Still Air
84.6
°C/W
Thermal Resistance Junction to Case
JC
Still Air
38.8
°C/W
Ambient Temperature
TA
–40
85
°C
Junction Temperature
TJ
——
125
°C
Table 9. Absolute Maximum Ratings1
Parameter
Symbol
Rating
Units
Maximum Operating Temperature
TAMAX
85
C
Supply Voltage, 1.8 V Option
VDD
–0.5 to +1.9
V
Supply Voltage, 2.5/3.3 V Option
VDD
–0.5 to +3.8
V
Input Voltage (any input pin)
VI
–0.5 to VDD + 0.3
V
Storage Temperature
TS
–55 to +125
C
ESD Sensitivity (HBM, per JESD22-A114)
ESD
2000
V
Soldering Temperature (Pb-free profile)2
TPEAK
260
C
Soldering Temperature Time @ TPEAK (Pb-free profile)
2
tP
20–40
seconds
Notes:
1. Stresses beyond those listed in Absolute Maximum Ratings may cause permanent damage to the device. Functional
operation or specification compliance is not implied at these conditions. Exposure to maximum rating conditions for
extended periods may affect device reliability.
www.silabs.com/VCXO for further information, including soldering profiles.
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